Analytical and Diagnostics Laboratory (ADL) is equipped with sate-of-the-art, high-tech equipment to enable failure analysis, materials and device characterization and processing. The lab occupies 8000 square feet of space in the Innovative Technology Complex at Binghamton University. The lab equipment are maintained by expert ADL scientists and engineers who also provide equipment training, operator services and consultative assistance to our academic and industry users. The lab staff is available for expert advice in all aspects of sample characterization ranging from sample preparation to measurement and data analysis.
Electron Microscopy Suite
The electron microscopy suite contains highly advanced secondary electron microscopes (SEM), transmission electron microscope (TEM) and dual beam focused ion beam (FIB/SEM) system to enable ultra-high resolution micro- and nano- structural characterization, compositional and chemical analysis and crystallographic information. Tooling also offers the ability to investigate non-conducting specimens without intrusive preparation and the possibility to introduce water vapor at sufficient pressures to avoid dehydration damage. The toolset is equipped with Energy Dispersive (EDS) and high resolution, highly sensitive Wavelength Dispersive (WDS), Electron Energy Loss (EELS) Spectroscopy for elemental analysis and mapping. One of the SEMs and FIB are equipped with Electron Back Scattered Diffraction (EBSD) systems for crystal orientation measurement and mapping. Two units in this suite are equipped with STEM detector. This suite is supported by extensive tool set for easy, fast and high-quality electron microscopy sample preparation.
X-Ray Diffraction Suite
The X-Ray Diffraction suite contains an XRD system and a small angle x-ray scattering (SAXS) system. XRD system provides a wide range of applications such as crystal phase identification, rocking curve analysis and reciprocal space mapping, reflectometry and thin film phase analysis, residual stress and texture analysis. SAXS system yields information such as particle size, size distribution, including shape and orientation distribution of nanocrystals in liquids, powders and bulk samples. SAXS technique applications range from life science and biotechnology (proteins, viruses, DNA complexes) to polymers, emulsions, liquid crystals, fibers and catalysts.
Surface Analysis Suite
This facility consists of an x-ray photoelectron spectroscopy (XPS) system for chemical analysis, scanning probe microscope (SPM) and profilers for 3D micro and nanostructural characterization, and a spectroscopic ellipsometer for optical properties and thin film thickness measurements. The XPS system is capable of micro and macro XPS analysis with the new focused x-ray spot technology as well as depth profiling, chemical state imaging, x-ray induced electron imaging and angle resolve analysis. The SPM is a multi-technique system equipped with AFM, conductive-AFM, MFM, SCM, nano-manipulation, nano-indentation, force modulation, fluid imaging capabilities. Ultra-high vacuum STM/AFM provides 3D atomic resolution imaging. The suite also contains stylus and optical profilers for 3D feature size, step height, surface roughness measurements. Spectroscopic ellipsometer can be used for thin film thickness measurements, 3D mapping and optical properties such as refractive index measurements.
Non-Destructive Testing Suite
This suite contains non-destructive analysis equipment such as x-ray inspection machine, scanning acoustic (C-SAM) and IR microscopes. These equipment are used for the non-destructive characterization of IC packages, BGAs, Flip chips, Bonded wafers, PCBs, Ceramic/ metals/ plastic components & compounds, Material characterization & analysis, Medical devices & structures etc. The x-ray imaging machine is capable of 3D CT scanning which can be used to construct a 3D movie depicting internal structure of a component. The C-SAM machine is equipped with several transducers and amplifiers for high resolution imaging of internal structures of a wide range of packages in pulse echo and transmission modes. The IR microscope gives thermal maps to identify hot spots on an active circuit in a system, and can also be used in a thermal transient mode to study fast thermal phenomena.
Thermal Analysis Suite
Thermal Analysis Suite (TAS) offers a broad range of instruments to characterize thermal, mechanical and physical properties of wide range of materials. TAS capabilities include accurate measurement of glass transition temperature, melting point, and other types of the first order transition temperature, determination of (i) weight loss/gain as a function of temperature and time for various compounds (ii) the byproducts of thermal decomposition of compounds (iii) thermal diffusivity, specific heat capacity, thermal conductivity (iv) linear and volumetric expansion (v) Young and Shear Modulus (vi) the crystallinity level of a polymer system (vii) dielectric properties (vii) relative levels of components in mixtures (viii) rheological properties of polymeric materials etc.
Optical Microscopy Suite
This facility provides high-resolution optical imaging in bright field, dark field, polarized light and differential interference contrast imaging modes with motorized optical microscopes. Instruments are available for imaging on upright and inverted stage formats, and upright stereo imaging with the ability to acquire stereo image pairs. Imaging includes digital imaging services such as extended depth of field, image stitching and mosaics, image enhancement and quantitative image analysis. The digital imaging services provide both real-time programmed control of the fully motorized microscopes and post processing image manipulation and analysis. Some of these services will be available online through the web.
This suite is also equipped with laser microscopy facilities such as laser scanning confocal microscopes. The suite finds applications in life sciences and engineering such as fluid flow studies in microchannels, 3D optical imaging of biological samples etc.