ENGINEERING AND SCIENCE RESEARCH LABS AND EQUIPMENT
UHV Scanning/Tunneling Microscope
AssistantProfessor, Mechanical Engineering Department
This microscope enables sample preparation under ultrahigh vacuum and reactive gases, thin film deposition by electron-beam evaporation, and surface structure and chemistry characterization by scanning tunneling microscopy, atomic force microscopy, low-energy electron diffraction and Auger electron spectroscopy. The system is configured to share all samples across the different vacuum chambers via sample handling and transfer.