Crystallography and Particle Size Analysis

This suite contains a four-circle X-ray diffractometer (XRD) with Cu K alpha anode laser particle size analyzer. XRD provides crystallographic information such as phase identification and crystal orientation analysis for semiconductors, metals, ceramics and various powder samples. Hot stage enables in situ heating up to ~1000 oC under ambient conditions. Laser particle size analyzer uses the scattering patterns of light produced when a particles of different sizes are exposed to a beam of light. As a result, particle size distribution can be investigated. Liquid or dry powders can be analyzed with no sample preparation and minimum operator intervention.