When a highly coherent X-ray beam is illuminated to crystalline samples, the atoms in the sample cause the incident X-ray beam to diffract into certain specific directions. By measuring the angles and intensities of the diffraction beams, the sample's crystallographic information in terms of lattice structure, lattice parameter and basic atomic positions in the unit cell can be determined. Since many materials form crystals, its applications include: investigation of crystal structure for various materials such as metals, semiconductors, insulators and minerals. This technique is also used to investigate residual stress and preferred orientation analysis for metals and semiconductor materials.
- Panalytical X’Pert PRO
- High resolution X-ray diffraction with Cu Ka radiation
- Multiple X-ray optic options: mirror, hybrid, and microbeam optics
- Phase analysis of powder and thin films samples
- Residual stress and preferred orientation of flat surface samples
- In situ heating stage (up to ~1000 oC)
Instrument Manager: In Tae Bae
