Variable Pressure SEM
- EVO 50 variable pressure SEM from Zeiss
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The SEM has SE and BSE detectors for surface morphology/topology as well as compositional contrast imaging
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EDS and WDS are available for elemental analysis. WDS allows high resolution elemental mapping to very low concentration
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It has LaB6 electron source, which has stable and long life filament
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Extended variable pressure option allows pressure up to 760Pa, providing capability to look at beam sensitive and non-conducting samples
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It is also equipped with Peltier Cold stage that has -50C to +40C temperature range
- Extended variable pressure option allows pressure up to 760Pa Provides ability to look at beam sensitive and non-conducting samples
- This SEM is also equipped with Peltier Cold stage with -50C to +40C temperature range.
Instrument Manager: Jenny Amey
Backup: In-Tae Bae