Transmission Electron Microscope (TEM)

Transmission Electron Microscope (TEM)

In TEM, high energy electrons (typically from 80 to 300 keV) go through the samples with <100nm thickness to generate various signals that can be used for imaging, electron diffraction and elemental analysis. TEM is particularly useful for: high resolution imaging using bright-field (BF) and dark-field (DF) techniques and chemical analysis using energy dispersive X-ray spectroscopy (EDS) and electron energy loss spectroscopy (EELS).

The analysis performed with very high spatial resolution, typically from a few micrometers down to a couple of nanometer scales in inorganic and organic samples. Its application includes: Nano-sized structure imaging with its chemical composition analysis; micro and crystal structure analyses such as lattice defect and domain structures; crystal growth mechanism study for epitaxially grown thin film materials; and in situ observation of thermally induced structural and chemical transformation in inorganic materials using heating and cooling holders.

  • High resolution TEM, JEOL JEM 2100F
  • Ultra high resolution: Point to point: 0.19 nm
  • Atomic lattice image: ~0.15 nm
  • Minimum probe size: ~0.5 nm
  • This TEM is equipped with
    • Ultra high resolution STEM detectors (BF, DF and HAADF) with 0.20 nm resolution
    • Compositional and chemical analysis capabilities with EDS, EFTEM, and EELS detectors
    • Dual acceleration voltages: 200 kV for inorganic materials, 120 kV for biological materials
    • Field-free Lorentz Imaging
    • Full Remote Operation
    • Dry Pumping System
    • Optical Bench - Free Lens Control
    • In situ heating (< ~1000oC) and cooling (liquid nitrogen) holders

Reserve the tool

Instrument Manager: In Tae Bae

Backup: Jenny Amey