IR microscope uses naturally emitted thermal infrared photons from samples to measure absolute temperature and/or hot spot of the sample.
Applications of this technique include: Two-dimensional thermal mapping with objectives (X2, X5, and X15); high-speed (~3 microsecond time increment) temperature measurement of a single area using transient detector; hot spot and short detection in electronic circuit boards; and transient junction temperature measurements.
- Infrared Microscope (Infrascope II) from Quantum Focus
- High resolution thermal mapping
- Detection of hot spot and shorts
- Live temperature imaging
- Measure junction temperatures
- QFI designed refractive infrared microscope objectives (2X, 5X, 15X), resolution 18-2.8 micron.
- Real time “every pixel” emissivity correction
- Stand alone image viewing and analysis software for remote analysis
- Computer-controlled fine focusing stage
- Single element, high-speed transient thermal detector, uses the same optics and the same measurement set-up
- InfraRed thermal pulse measurement
- Calibrated temperature vs. time output
- 3 dB bandwidth of 250 KHz
Instrument Manager: In Tae Bae
Back-up: Dae Young Jung
