Supra 55 FE-SEM upgraded with the new EDS and EBSD detectors
The Energy Dispersive Spectroscopy (EDS) and Electron Backscatter Diffraction (EBSD) detectors were recently upgraded on the Supra 55 SEM.
The new EDAX Velocity EBSD has exciting features and benefits as follows:
-
- Data collection rates up to 3000 points per second: EBSD maps can be collected in minutes with high Confidence Index.
- High-speed, low-noise CMOS sensor: Provides high sensitivity and low noise.
- High indexing success rates: Triplet indexing scheme and Confidence Index provide unparalleled indexing performance.
- Wide range of applicable materials: Includes lower symmetry, multi-phase ad deformed structures.
GE Nanome|X X-ray system had a major upgrade
On-site SEM training for local companies
Dae-Young Jung and Jennifer Amey provided on-site Scanning Electron Microscopy (SEM) and Energy Dispersive X-ray Spectroscopy (EDS) classes with hands-on training for engineers and technicians at Lockheed Martin in Owego, N.Y., and Amphenol in Sidney, N.Y. The training covered fundamental aspects of scanning electron microscopy, X-ray energy dispersive spectroscopy and practical usage of the instrument.
Scouts visit the ADL
As a part of the ADL’s outreach program, a group of scouts and their families, led by IEEC Associate Director Benson Chan, visited the ADL in January 2020 to learn about the lab and its activities. Anju Sharma, ADL senior scientist, gave demos of the workings of a scanning electron microscope and its application in finding out the size, shape, structure and chemistry of pollen grains of various flowers. ADL research engineer Bill Butler engaged the scouts in interactive, hands-on experiments with liquid nitrogen to exhibit its unique properties in a fun-filled yet safe learning environment. The lab tour allowed scouts to learn about practical, real-life applications and possibilities of science and engineering, an experience beyond any classroom.
