Our Team

Background

Anju Sharma received her PhD in physics from Delhi University, India, and earned a master’s degree in materials science and engineering from Lehigh University in Pennsylvania. She joined the Binghamton University staff in 2007. Sharma has extensive experience and background in non-destructive analysis using scanning acoustic microscopy (C-SAM), 2D X-ray imaging and 3D Computer Tomography (CT); surface analytical techniques such as atomic force microscopy (AFM), X-ray photoelectron spectroscopy (XPS), secondary electron microscopy (SEM), ellipsometry, profilometry and FTIR spectroscopy ultra-high vacuum scanning tunneling microscopy (UHV-STM). She has also performed device fabrication using photolithography and e-beam lithography. Sharma, who has published more than 40 technical papers in peer-reviewed journals and conference proceedings, also has taught graduate and undergraduate courses in physics.