Optical profiler is a non-contact surface metrology technique that measures high-resolution 3D surface topography, film thickness and surface roughness. ADL owns a Wyko NT 1100 system from Veeco Instruments (now Bruker). It has capabilities such as:
- Sub-nanometer vertical resolution at all magnifications
- Sub-nanometer roughness to millimeter-high step measurements
- Motorized, programmable stage for stitching images from large areas
- Multiple objective lenses
- Comprehensive Vision® analysis software
Instrument Manager: Bill Butler
Back-up: Anju Sharma
