Microelectronics core

This Core designs and characterizes microelectronics devices. It includes a wide range of instruments for measuring the characteristics of digital, analog, and mixed-signal electronic systems. The facility contains a network analyzer, high-performance oscilloscopes, and a full complement of modern electronic equipment as well as environmental chambers for testing the reliability of electronic circuits and systems.

Contact:

Zhanpeng Jin - Assistant Professor, Electrical and Computer Engineering - zjin@binghamton.edu

Location:

ES 1100