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The Thomas J. Watson School of Engineering and Applied Science

Microelectronics core

This Core designs and characterizes microelectronics devices. It includes a wide range of instruments for measuring the characteristics of digital, analog, and mixed-signal electronic systems. The facility contains a network analyzer, high-performance oscilloscopes, and a full complement of modern electronic equipment as well as environmental chambers for testing the reliability of electronic circuits and systems.

Contact:

Zhanpeng Jin - Assistant Professor, Electrical and Computer Engineering - zjin@binghamton.edu

Location:

ES 1100

 

Last Updated: 4/27/18